Nikos Kehagias

Nikos Kehagias

Nikos Kehagias

Flexible Imprinting Platform and P2N Group

Biography: Since 2010 Dr N. Kehagias is leading the Flexible Nanoimprint Lithography Platform of the Catalan Institute of Nanoscience and Nanotechnology (ICN2). He obtained his PhD in 2007 from the National University of Ireland, Cork where he continued to work as a post-doctoral fellow until May 2008. In May 2008 he joined the Phononic and Photonic Nanostructures group in the Catalan Institute of Nanotechnology (ICN-CIN2). His research work focuses on the study and developed of novel nano-manufacturing (roll to roll nanoimprint lithography and nano-injection moulding) methods based on imprint lithography techniques. In the last years his research efforts have been focused on developing nano-enabled plastic components and devices based on bio-mimicking properties. Dr. Kehagias had been working in the past on polymer optical and photonic devices with an emphasis on photonic crystal applications for light extraction purposes.

Abstract Title: Advanced manufacturing techniques for high-rate replication and non-invasive monitoring of nano-enabled plastic surfaces.

Abstract: In this talk, we present novel nanofabrication methods suitable to realize and replicate hierarchical structures over large areas with high repetition rates. Our manufacturing technology if based on nanoimprint lithography methods in combination with electroplating techniques. Direct replication of such structures in commercial plastic materials demonstrate their dynamic behavior towards water and oils, providing exceptional functionality.

Based on optical diffraction imaging we present a novel non-destructive metrology set up to monitor sub-wavelength variation in the critical dimensions of nanostructures. Our set up is integrated within our roll-to-roll nanoimprint lithography machine providing real time quality control of our produced nanostructured films.

Read more about Nikos and his work here.

Speaker of SESSION 12: NANOMANUFACTURING, CHARACTERISATION AND METROLOGY